Insertion & Return Loss
FEXT ( Far End Cross Talk )
Eye-Diagram ( Optional, option TDR required )
To test all these items, significant amount of time is required. This solution can reduce test time dramatically.
Introduction
Expand ENA ports to increase test throughput
Flexible configuration to expand VNA ports to 8x ports
Automation program to control all hardware and provide pass/fail result
One-time connection to full test all items in Time domain, Frequency domain and Eye Diagram
Standard calibration, ECal and De-Embedded method to allow operator to perform accurate test
Report generation
Barcode function to allow you further enhance report data structure easier
Supported Test Items
．N.P. ( Negative/Positive wiring correction )
．Mated, Cable
．Intra-Pair Skew
．Insertion Loss
．Inter-Pair Skew
．Return Loss
．Diff. Mode Impedance
．Mode Conversion
．Mated, Cable
．FEXT
．Comm. Mode Impedance
．Eye-Diagram ( Optional, option TDR required )
Configuration
Configuration
Full test for one cable
． In 100 seconds
Factors affect test time are：
． Number of selected test items
． Number of sweep points in ENA
Software Screenshot
De-Embedding
De-embedding moves the measurement plane from the instrument connectors to the switch connectors
Two steps：
． Calibrate the ENA-TDR by using the ECal module
． Measure the four paths of DUT and save the de-embedding files.
Product Quality Test
Demands
Company Profile
